Oxide Reliability: A Summary of Silicon Oxide Wearout,...

Main
Engineering
Oxide Reliability: A Summary of Silicon...

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)

Name: Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)
ISBN: 9789812778062

D. J. Dumin

0 / 0

0 comments

Bạn thích cuốn sách này tới mức nào?

Chất lượng của file scan thế nào?

Xin download sách để đánh giá chất lượng sách

Chất lượng của file tải xuống thế nào?

A summary of the state of our knowledge of oxide reliability. The articles have been written by experts in the field. The work should be useful to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

Thể loại:

Engineering

Năm:

2002

Nhà xuát bản:

World Scientific Publishing Company

Ngôn ngữ:

english

Trang:

280

ISBN 10:

9812778063